A new paper just published in Physical Review Letters introduces our Unified Modulated Pattern Analysis (UMPA) method, which improves speckle tracking techniques by combining multiple measurements to increase resolution and sensitivity. In the paper we demonstrate that the method applies equally well to random (speckles) and regular (e.g. grating) patterns.
The phase, transmission and dark-field parts of a flower bud reconstructed using UMPA.
An implementation of the method is available on github.
Our paper:
[bibtex key=Zdora2017]
